Noise Analysis of Sampled Analog Circuits

Noise analysis method of sampled analog circuits (e.g. switched-capacitor circuits) using transfer function-based and transient analyses are investigated. For both the thermal and 1/f noise components, the transfer function-based and the transient analyses of a high-gain column amplifier for CMOS image sensors are in good agreement.

Signal readout circuit of a CMOS image sensor using switched-capacitor circuits.	Comparison of the two methods (Input referred r.m.s. noise).

References

1. N. Kawai, S. Kawahito,"Noise analysis of high-gain low-noise column readout circuits for CMOS image sensors", IEEE Trans. Electron Devices, Vol.51, No.2, pp.185-194, 2004