Low-Noise Readout Circuits

A very low-noise readout circuit can be realized with a high-gain column amplifier and a double-stage noise-canceling architecture which is composed two noise-canceling amplifiers for CMOS image sensors. As a result of the measurement of an implemented CMOS line image sensor, it is demonstrated that the proposed double-stage architecture showed the better noise performance than that of the single-stage for high-gain. 49.1uV_rms can be obtained as the noise voltage.

Implemented signal readout circuit for CMOS image sensors.	Noise reduction effect.

References

1. N. Kawai, S. Kawahito,"Noise analysis of high-gain low-noise column readout circuits for CMOS image sensors", IEEE Trans. Electron Devices, Vol.51, No.2, pp.185-194, 2004
2. N. Kawai and S. Kawahito, "Measurement of Low-Noise Column Readout Circuits for CMOS Image Sensors", IEEE Trans. Electron Devices, Vol.53, No.7, pp.1737-1739, 2006